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Speedy high sensitivity analysis of RoHS regulated substances |
Ease of operation (load and click) |
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High sensitivity detection of trace elements using a Si-Li semiconductor detector effective for heavy elements combined with an X-ray filter optimized for screening of RoHS regulated chemical substances. |
A single click on the dedicated analysis menu will begin screening of Cd, Pb, Hg, Br, and Cr, and display screening results after applying morphological and material correction. |
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Analytical results in various forms (documentation software) |
Ni plating software (option) |
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The software offers user-programmable templates for management and documentation of RoHs compliance screening results. |
The software is designed to automatically correct the thickness of plating and the effect of substrate, enhancing the screening accuracy of Pb contained in plating. |
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JSX-3100RII Specifications |
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Elements analyzed |
Na to U |
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X-ray source |
Rh target, 5 to 50 kV, 1 mA, 50 W |
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Filter |
4 types (including open) automatically changed |
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Collimator |
1 mm, 3 mm, and 7 mm diameter |
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Detector |
Liquid nitrogen free Si (Li) semiconductor detector |
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Specimen chamber size |
300 mm dia. x 150 mm (H) |
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Data processor |
Windows® XP, liquid crystal display, color printer |
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RoHS analysis |
For 5 elements in plastics, 5 elements in metals, Sn plating (option), and Ni plating (option) |
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General analysis |
Bulk FP, thin film FP, calibration curve |
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Option |
CCD camera, 16 sample exchanger, vacuum system |
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Dimensions/weight of base unit |
650 (W) x 810 (D) x 460 (H); approx. 90 kg |
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